September 6, 2007
Olympus Integrated Technologies America Completes Sale of AL3300 Wafer Inspection and Defect Review System to US IDM |
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August 17, 2007
Olympus Integrated Technologies America Receives Attendees' Choice Award at SEMICON West for its FR3200 BB-DUV Defect Review System |
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July 17, 2007
Olympus Integrated Technologies America Demonstrates Broadband DUV Imaging on the FR3200 Wafer Inspection and Automated Defect Review System at SEMICON West |
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December 5, 2006
Olympus Integrated Technologies America Names Greg Baker President |
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November 7, 2006
Olympus-ITA Receives Fourth Order to Supply Wafer and Defect Review Systems to Major Integrated Device Manufacturer |
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October 17, 2006
Olympus-ITA Wafer Receives First Order from Large U.S. IDM for Inspection and Defect Review Systems |
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July 11, 2006
Olympus-ITA Wafer Loader and Manual Inspection System Handles 300mm Wafers |
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July 7, 2006
Olympus System Inspects Wafer Top, Back, Edge, and Bevel |
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November 8, 2005
Olympus-ITA Receives Repeat Order to Supply Wafer and Defect Review Systems to Major Integrated Device Manufacturer |
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July 12, 2005
Olympus-ITA System Inspects Wafer Bevel, Top, Side, and Bottom |
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February 15, 2005
Olympus-ITA's AL3100 Performs Inspection & Defect Review on 200 and 300mm Wafers |
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January 13, 2005
Olympus Integrated Technologies America to Supply Wafer and Defect Review Systems to Major Integrated Device Manufacturer |
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November 18, 2002
Olympus Integrated Technologies America Enters into Agreement with International Sematech for the Applications Development of Deep UV Imaging Technology |
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April 23, 2002
Olympus Integrated Technologies America Signs Loomis Group to Meet Brand Development Needs |
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March 18, 2002
Olympus Announces MEMS (Micro-electromechanical Systems) Foundry Services |
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January 22, 2002
Partnership Development Group Established by Olympus Integrated Technologies America, Inc. |
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January 11, 2002
Olympus Integrated Technologies America Announces Vice President of Technology |
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March 20, 2001
Olympus Receives Order For Multiple 300mm Wafer Inspection Systems |
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January 23, 2001
Olympus Integrated Technologies America (OITA) is a Featured Exhibitor at this year's SPIE Microlithography Conference |
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October 4, 2000
Olympus Integrated Technologies America Moves Into New Silicon Valley Headquarters |
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