Report Formats: Intel from inside the market, and the competition.

Circuit Analysis Reports:

• Circuit Analysis Reports (CAR): Full or selected circuit extraction.
• Functional Analysis Reports (FAR): Functional block analysis and basic process information.

Process Analysis Reports:

• Structural Analysis Report (SAR): Comprehensive reports that reveal details of the die fabrication process.
• Process Review Reports (PPR): A breadth of process knowledge without the added cost of TEM and materials analysis.
• Imager Process Review Reports (IPR): Focuses on the general processing of an image sensor die, highlighting specialized pixel array processes.
• Chiptease Reports (CTR): A basic process analysis of a die's essential information - and a cost-effective means to assess the need for further analysis.

Transistor Characterization Reports:

• Transistor Characterization Reports (TCR): Provides a benchmark to measure your designs against commercially-available parts and published data.

Custom Reports

Describing two types of services. The first is a report on a specialized devices (or block) that is of singular benefit to a very specific problem. The second is analysis that must be kept fully confidential. In these cases Chipworks will engage with you as a service organization to provide specifically what information you need in an timely manner. Results will be published with same consistently high-quality as our product reports.